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    真理光學(xué)儀器有限公司專(zhuān)注于顆粒表征儀器的研發(fā)和制造，產(chǎn)品涵蓋激光（衍射法）粒度分析儀、動(dòng)態(tài)光散射納米粒度及Zeta電位分析儀以及顆粒圖像分析儀，既有實(shí)驗(yàn)室儀器，又有在線檢測(cè)系統(tǒng)。真理光學(xué)秉持“科學(xué)態(tài)度，工匠精神”，為用戶提供粒度產(chǎn)品和服務(wù)。

    真理光學(xué)匯集了以張福根博士為代表的全國(guó)顆粒表征領(lǐng)域的人才。張福根博士現(xiàn)任本公司董事長(zhǎng)兼首席科學(xué)家，還擔(dān)任全國(guó)顆粒表征及分檢與篩網(wǎng)標(biāo)準(zhǔn)化技術(shù)委員會(huì)副主任委員、天津大學(xué)兼職教授，曾擔(dān)任中國(guó)顆粒學(xué)會(huì)副理事長(zhǎng)，同時(shí)也是“歐美克”字號(hào)公司的創(chuàng)始人。曾擔(dān)任英國(guó)某粒度儀器公司中國(guó)總經(jīng)理20余年的秦和義先生擔(dān)任本公司商務(wù)總經(jīng)理，中國(guó)顆粒學(xué)會(huì)青年理事潘林超博士、陳進(jìn)博士擔(dān)綱公司的研發(fā)主力。

    激光（衍射法）粒度儀雖然已得到廣泛應(yīng)用，但是在很多方面還存在需要改進(jìn)的地方，不論是科學(xué)基礎(chǔ)方面，還是技術(shù)方案方面。真理光學(xué)的團(tuán)隊(duì)針對(duì)當(dāng)前市面上儀器存在的不足，展開(kāi)了系統(tǒng)的理論研究和技術(shù)創(chuàng)新，發(fā)現(xiàn)了衍射光斑（愛(ài)里斑）的反常變化現(xiàn)象（ACAD），解釋了為什么不能測(cè)量3μm左右的聚苯乙烯微球，并給出了反常區(qū)（不能測(cè)量粒徑）的一般公式；研究了衍射儀器的測(cè)量上限和下限；研究了顆粒折射率偏差對(duì)測(cè)量結(jié)果的影響，發(fā)明了兩種根據(jù)散射光分布估算顆粒折射率的方法;提出了斜置梯形窗口技術(shù)方案，解決了前向超大角測(cè)量盲區(qū)的問(wèn)題，使衍射儀器的亞微米顆粒測(cè)量水平得到提高;提出了統(tǒng)一的反演算法（專(zhuān)有技術(shù)），消除了不同計(jì)算模式給出不同結(jié)果的尷尬；設(shè)計(jì)出了高達(dá)20Kfps的超高速并行數(shù)據(jù)采樣電路，使干法測(cè)量的精度不亞于濕法測(cè)量，對(duì)高速?lài)婌F場(chǎng)的測(cè)量（時(shí)間）分辨率也更高。

    在納米粒度及Zeta電位儀方面，真理光學(xué)提出了比相位分析法（PALS）更先進(jìn)的余弦擬合相位分析法（CF-PALS），用光纖分束取代了傳統(tǒng)的平板分束鏡分束，用光纖內(nèi)光干涉取代了自由空間干涉，使Zeta電位的測(cè)量重復(fù)性大幅度提高。
 

Linkoptik Instruments specializes in the R&D and manufacturing of particle characterization instruments. Its product portfolio includes laser diffraction particle size analyzers, dynamic light scattering nanoparticle size & zeta potential analyzers, and particle image analyzers, covering both laboratory instruments and online monitoring systems. Adhering to the spirit of “Scientific Attitude and Craftsmanship”, Linkoptik Instruments provides customers with professional particle sizing products and services.

• Discovered the Abnormal Change of Airy Diffraction pattern (ACAD), explained the difficulty in accurately measuring polystyrene microspheres around 3 μm, and derived a general formula for the invalid measurement size range;
• Studied the upper and lower measurement limits of laser diffraction instruments;
• Investigated the influence of particle refractive index deviation on measurement results, and developed two methods for estimating particle refractive index based on scattered light distribution;
• Proposed an inclined trapezoidal window design to eliminate the large forward-angle measurement blind zone, greatly improving sub-micron particle measurement performance;
• Developed a proprietary unified inversion algorithm that removes inconsistencies among results from different calculation models;
• Designed an ultra-high-speed parallel data acquisition circuit up to 20,000 fps, enabling dry measurement to achieve accuracy comparable to wet measurement, with higher temporal resolution for high-speed spray field analysis.